Scanning Electron Microscope w/ EDX Laboratory
Trialon has the equipment and experienced staff to operate this highly technical piece of laboratory equipment. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
Scanning Electron Microscope w/ EDX Capabilities
- Imaging from 30X to +1000X with high depth of field/li>
- Variable pressure capability to inhibit charging artifacts in non-conductive samples
- High vacuum mode for imaging conductive materials (metals)
- Low pressure mode for imaging non-conductive materials (ceramics, plastics)
- Secondary electron detector for imaging topographical features
- Back scattered electron detector for representation of compositional information
- Inage controlled by average molecular weight
Scanning Electron Microscope w/ EDX Applications
- Failure analysis; fracture, corrosion and wear
- Phase distribution; coatings
- Voltage contrast imaging
Additional Materials Analysis Services
